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Depth Height Measuring Instrument×日商精密光学 - List of Manufacturers, Suppliers, Companies and Products

Depth Height Measuring Instrument Product List

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AF Micron Depth and Height Measuring Machine

Specification changes and customization according to usage in an economical way!

This is a new type of depth and height measurement device that combines slit image observation using light interruption with autofocus tracking using spot light images.

  • Other measurement, recording and measuring instruments
  • Optical Measuring Instruments

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Light Cut-off Measurement Device Horizontal Micron Depth and Height Measuring Instrument

You can easily measure the cross-sectional shapes of wall surfaces, side surfaces, and ring-shaped inner wall surfaces, as well as the displacement of uneven surfaces, while looking at the TV monitor screen!

The cross-sectional shapes of wall surfaces, side surfaces, and ring-shaped inner wall surfaces, as well as the measurement of uneven surfaces, can be easily measured while viewing the TV monitor screen. The measurement platform aligns the measurement surface through movement along the XY axes, allows observation of the inner wall surface direction through rotation of the θ table, enables vertical movement in the height direction along the Z axis, and allows fine adjustments along the Y' axis to measure uneven surfaces in units of 1μm.

  • Food Testing/Analysis/Measuring Equipment

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Slit Intersecting Depth and Height Measuring Device

A light-sectioning measurement microscope that uses slit light for non-contact measurement of height and depth in units of 1 μm.

It is an optical sectioning measurement microscope that uses slit light to measure height and depth in units of 1 μm without contact.

  • Optical microscope

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Micron Depth Height Measuring Machine

Measure depth and height with a direct reading using a digital gauge! You can check for irregularities with slit light.

This product is a light-section measurement microscope that uses slit light for non-contact measurement of depth and height in 0.1μm units. By utilizing slit light, it can non-contact measure minute elevations, depressions, thicknesses, steps, as well as eccentricities, runouts of rotating objects, and deviations of moving objects. Additionally, the television monitor uses a super high-sensitivity type, allowing for extremely bright images. 【Features】 ■ Non-contact measurement using slit light ■ Direct reading with a digital gauge ■ Efficient measurement with a television monitor ■ Collection of measurement records using a Polaroid camera *For more details, please download the PDF or feel free to contact us.

  • Other microscopes

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